Measurement of intensity of directionally diffuse streaks on a four-circle diffractometer: divergence correction factors for bisecting setting

Pandey, D. ; Prasad, L. ; Lele, S. ; Gauthier, J. P. (1987) Measurement of intensity of directionally diffuse streaks on a four-circle diffractometer: divergence correction factors for bisecting setting Journal of Applied Crystallography, 20 . pp. 84-89. ISSN 0021-8898

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Official URL: http://scripts.iucr.org/cgi-bin/paper?a27721

Related URL: http://dx.doi.org/10.1107/S0021889887087089

Abstract

Because of the inherent beam divergence, point intensities measured using a four-circle diffractometer at equispaced points along the diffuse streak correspond to variable lengths of the streak. Correction factors required to convert the measured intensities into those corresponding to a fixed length at each equispaced point along the diffuse streak are derived for two different crystal mountings under bisecting geometry. A procedure for experimentally verifying the mathematical approach employed in these calculations is also described.

Item Type:Article
Source:Copyright of this article belongs to International Union of Crystallography.
ID Code:88767
Deposited On:29 Mar 2012 14:35
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