Method of skew measurement of thin megnetic films

Pitke, M. (1996) Method of skew measurement of thin megnetic films IEEE Transactions on Magnetics, 12 (3). pp. 774-776. ISSN 0018-9464

Full text not available from this repository.

Official URL: http://ieeexplore.ieee.org/Xplore/login.jsp?url=ht...

Related URL: http://dx.doi.org/10.1109/TMAG.1966.1065979

Abstract

This article does not have an abstract.

Item Type:Article
Source:Copyright of this article belongs to IEEE.
ID Code:86184
Deposited On:08 Mar 2012 11:13
Last Modified:08 Mar 2012 11:13

Repository Staff Only: item control page