Kumar, N. ; Subramanian, R. R.
(1974)
*A probabilistic approach to the problem of electron localization in disordered systems and sharpness of the mobility edge*
Journal of Physics C: Solid State Physics, 7
(10).
pp. 1817-1821.
ISSN 0022-3719

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Official URL: http://iopscience.iop.org/0022-3719/7/10/008/

Related URL: http://dx.doi.org/10.1088/0022-3719/7/10/008

## Abstract

By applying the theory of the asymptotic distribution of extremes and a certain stability criterion to the question of the domain of convergence in the probability sense, of the renormalized perturbation expansion (RPE) for the site self-energy in a cellularly disordered system, an expression has been obtained in closed form for the probability of nonconvergence of the RPE on the real-energy axis. Hence, the intrinsic mobility mu (E) as a function of the carrier energy E is deduced to be given by mu (E)= mu _{0}exp(-exp( mod E mod -E_{c}) Delta ), where E_{c} is a nominal 'mobility edge' and Delta is the width of the random site-energy distribution. Thus mobility falls off sharply but continuously for mod E mod >E_{c}, in contradistinction with the notion of an abrupt 'mobility edge' proposed by Cohen et al. and Mott. Also, the calculated electrical conductivity shows a temperature dependence in qualitative agreement with experiments on disordered semiconductors.

Item Type: | Article |
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Source: | Copyright of this article belongs to Institute of Physics. |

ID Code: | 85086 |

Deposited On: | 29 Feb 2012 12:06 |

Last Modified: | 29 Feb 2012 12:06 |

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