The influence of trace elements on grain boundary proceses in yttria stabilized tetragonal zirconia

Chokshi, A. H. ; Yoshida, H. ; Ikuhara, Y. ; Sakuma, T. (2003) The influence of trace elements on grain boundary proceses in yttria stabilized tetragonal zirconia Materials Letters, 57 (26-27). pp. 4196-4201. ISSN 0167-577X

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Official URL: http://www.sciencedirect.com/science/article/pii/S...

Related URL: http://dx.doi.org/10.1016/S0167-577X(03)00289-1

Abstract

Experimental results on a 2 mol% yttria-stabilized tetragonal zirconia (2YTZ) reveal that grain growth is accelerated by Al segregation to boundaries even in the absence of an amorphous grain boundary phase. This is consistent with an analysis of Coble diffusion creep indicating an increase in grain boundary diffusion coefficient with the segregation of Al to grain boundaries.

Item Type:Article
Source:Copyright of this article belongs to Elsevier Science.
Keywords:Grain boundary; Diffusion; Grain growth; Segregation; Creep; Zirconia
ID Code:84175
Deposited On:24 Feb 2012 11:29
Last Modified:24 Feb 2012 11:29

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