Satapathy, S. ; Verma, Prabha ; Gupta, P. K. ; Mukherjee, Chandrachur ; Sathe, V. G. ; Varma, K. B. R. (2011) Structural, dielectric and ferroelectric properties of multilayer lithium tantalate thin films prepared by sol-gel technique Thin Solid Films, 519 (6). pp. 1803-1808. ISSN 0040-6090
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Official URL: http://www.sciencedirect.com/science/article/pii/S...
Related URL: http://dx.doi.org/10.1016/j.tsf.2010.10.016
Abstract
Multilayer lithium tantalate thin films were deposited on Pt-Si [Si(111)/SiO2/TiO2/Pt(111)] substrates by sol-gel process. The films were annealed at different annealing temperatures (300, 450 and 650 °C) for 15 min. The films are polycrystalline at 650 °C and at other annealing conditions below 650 °C the films are in amorphous state. The films were characterized using X-ray diffraction, atomic force microscopy (AFM) and Raman spectroscopy. The AFM of images show the formation of nanograins of uniform size (50 nm) at 650 °C. These polycrystalline films exhibit spontaneous polarization of 1.5 µC/cm2 at an application of 100 kV/cm. The dielectric constant of multilayer film is very small (6.4 at 10 kHz) as compared to that of single crystal.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| Keywords: | Sol-gel Process; Lithium Tantalate; Atomic Force Microscopy; Hysteresis; Dielectric Properties; Raman Spectroscopy; X-ray Diffraction |
| ID Code: | 83471 |
| Deposited On: | 21 Feb 2012 12:59 |
| Last Modified: | 21 Feb 2012 12:59 |
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