Oxygen vacancy related relaxation and conduction behavior in (1-x) NBT-xBiCrO3 solid solution

Selvamani, R. ; Singh, G. ; Tiwari, V. S. ; Gupta, P. K. (2012) Oxygen vacancy related relaxation and conduction behavior in (1-x) NBT-xBiCrO3 solid solution Physica Status Solidi A, 209 (1). pp. 118-125. ISSN 0031-8965

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Official URL: http://onlinelibrary.wiley.com/doi/10.1002/pssa.20...

Related URL: http://dx.doi.org/10.1002/pssa.201127424

Abstract

The ac-conductivity measurements carried out on (1-x)NBT-xBiCrO3 solid solution in the radio frequency range. The conductivity measurements suggest that with increase in BiCrO3 content the electrical conductivity of sodium bismuth titanate (Na0.5Bi0.5TiO3) (NBT) increases. For x=0.10 and 0.15 two relaxation behaviors are observed, related to long range conduction and short range hopping of defects. Activation energy calculated from dielectric relaxation as well as conductivity data reveals that both the processes are due to oxygen defects formed by substitution of chromium at titanium site. A reasonable decrease in the conductivity and dielectric loss were observed after oxygen annealing of the samples. Presence of relaxation peaks even after oxygen annealing suggests that relaxation is mainly by extrinsic oxygen defects produced due to substitution of chromium.

Item Type:Article
Source:Copyright of this article belongs to John Wiley and Sons.
Keywords:Dielectric Relaxation; Impedance Spectroscopy; Oxygen Defects
ID Code:83450
Deposited On:21 Feb 2012 13:09
Last Modified:21 Feb 2012 13:09

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