Infinite family of persistence exponents for interface fluctuations

Constantin, M. ; Das Sarma, S. ; Dasgupta, C. ; Bondarchuk, O. ; Dougherty, D. B. ; Williams, E. D. (2003) Infinite family of persistence exponents for interface fluctuations Physical Review Letters, 91 (8). 086103_1-086103_4. ISSN 0031-9007

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We show experimentally and theoretically that the persistence of large deviations in equilibrium step fluctuations is characterized by an infinite family of independent exponents. These exponents are obtained by carefully analyzing dynamical experimental images of Al/Si(111) and Ag(111) equilibrium steps fluctuating at high (970 K) and low (320 K) temperatures, respectively, and by quantitatively interpreting our observations on the basis of the corresponding coarse-grained discrete and continuum theoretical models for thermal surface step fluctuations under attachment/detachment ("high-temperature") and edge-diffusion limited kinetics ("low-temperature"), respectively.

Item Type:Article
Source:Copyright of this article belongs to The American Physical Society.
ID Code:83253
Deposited On:17 Feb 2012 04:11
Last Modified:17 Feb 2012 04:11

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