Jha, Neeraj K. ; Ramgopal Rao, V. ; Woo, J. C. S. (2002) Optimization of single halo p-MOSFET implant parameters for improved analog performance and reliability Proceedings of the 32nd European Solid-State Device Research Conference (ESSDERC), Florence, Italy . pp. 603-606.
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Abstract
The effect of Channel Hot Carrier (CHC) stress under typical analog operating conditions is studied for p-MOSFETs. Our detailed characterization results show that Single Halo devices not only show improved performance, but also are immune to CHC degradation under various operating conditions.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Proceedings of the 32nd European Solid-State Device Research Conference (ESSDERC), Florence, Italy. |
| ID Code: | 80937 |
| Deposited On: | 02 Feb 2012 14:27 |
| Last Modified: | 18 May 2016 22:41 |
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