Inani, A. ; Ramgopal Rao, V. ; Cheng, B. ; Cao, M. ; Voorde, P. V. ; Greene, W. ; Woo, J. C. S. (1998) Performance considerations in using high-k dielectrics for deep sub-micron MOSFETs Proceedings of the Solid state Devices and Materials (SSDM) Research Conference, Hiroshima, Japan . pp. 94-95.
Full text not available from this repository.
Abstract
This article does not have an abstract.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Proceedings of the Solid state Devices and Materials (SSDM) Research Conference, Hiroshima, Japan. |
| ID Code: | 79806 |
| Deposited On: | 28 Jan 2012 11:43 |
| Last Modified: | 28 Jan 2012 11:43 |
Repository Staff Only: item control page
