Anil, K. G. ; Mahapatra, S. ; Ramgopal Rao, V. ; Eisele, I. (2000) Comparison of sub-bandgap impact ionization in deep-sub-micron conventional and lateral asymmetrical channel nMOSFETs Proceedings of the International Conference on Solid state Devices and Materials (SSDM) Sendai, Japan . pp. 60-61.
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| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Proceedings of the International Conference on Solid state Devices and Materials (SSDM) Sendai, Japan. |
| ID Code: | 79794 |
| Deposited On: | 28 Jan 2012 11:45 |
| Last Modified: | 28 Jan 2012 11:45 |
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