Morphology of growing interfacial patterns

Chowdhury, Debashish (1988) Morphology of growing interfacial patterns Journal of Statistical Physics, 50 (5-6). pp. 1111-1130. ISSN 0022-4715

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A study is made of the morphology of the interfacial patterns in the solid-on-solid model evolving from initial states very far from equilibrium. Monte Carlo simulation is used to study the time dependence of the length, the diffuseness, and the width of the interface during such evolution in the absence as well as in the presence of quenched random field. Moreover, the technique of Walsh-Fourier transform is introduced for analyzing the noise level in such interfacial patterns. A quantity is also introduced that characterizes the interfacial structure locally on a very short length scale. Finally, the latter technique is also applied to the kinetic Ising model evolving from a random initial configuration.

Item Type:Article
Source:Copyright of this article belongs to Springer-Verlag.
Keywords:SOS Model Interfaces; Walsh Transform
ID Code:7709
Deposited On:25 Oct 2010 10:46
Last Modified:25 Oct 2010 10:46

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