Detection of surface lattice defects using line scan method

Abstract

The presence of different kinds of surface lattice defects such as missing atom, interstitial atom, line defects, in graphite single crystal have been identified by using scanning tunneling microscope. These defects cause displacement of atoms from their mean position and lattice strain is introduced. By measuring the displacement of atoms from their mean position. lattice strain has been calculated. It is found that among single point defects, vacancies cause maximum lattice strain.