Kulkarni, Sneha A. ; Mulla, Imtiaz S. ; Vijayamohanan, Kunjukrishna (2006) Electrochemical characterization of self-assembled monolayers on semiconducting substrates for MEMS applications Journal of Physics: Conference Series, 34 (34). pp. 322-329. ISSN 1742-6588
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Official URL: http://iopscience.iop.org/1742-6596/34/1/053
Related URL: http://dx.doi.org/10.1088/1742-6596/34/1/053
Abstract
Passivating behavior of Self-assembled monolayers (SAMs) of octadecyltrichlorosilane (OTS) on an n-type Si (100) electrode has been investigated with and without a redox species like ferrocene in polar non-aqueous medium. The electron transfer behavior of ferrocene is found to be drastically affected by the presence of monolayer and reasons for this are analyzed as a function of change in resistance, dielectric thickness and coverage of the monolayer. The thickness and the coverage of the monolayer are 2.17 nm and 99.8% respectively. Further contact angle measurements illustrate the change in hydrophobicity and homogeneity of the Si substrate after derivatived with SAM.
Item Type: | Article |
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Source: | Copyright of this article belongs to Institute of Physics. |
ID Code: | 68929 |
Deposited On: | 08 Nov 2011 04:40 |
Last Modified: | 08 Nov 2011 04:40 |
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