Structure and electrical transport properties of Al-Cu-Cr quasicrystals

Banerjee, S. ; Goswami, R. ; Chattopadhyay, K. ; Raychaudhuri, A. K. (1995) Structure and electrical transport properties of Al-Cu-Cr quasicrystals Physical Review B, 52 (5). pp. 3220-3233. ISSN 0163-1829

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Transport properties of quasicrystals in rapidly solidified as well as heat-treated Al65Cu20Cr15 alloys were studied over a wide temperature range as a function of structure and microstructure. The characterization was done using x-ray diffraction, transmission electron microscopy, and differential scanning calorimetry. Particular attention was paid to primitive to face-centered quasicrystalline transformation which occurs on annealing and the effect of microstructures on the transport behavior. The temperature dependence of resistivity is found to depend crucially on the microstructure of the alloy. Further, ordering enhances the negative temperature coefficient of resistivity. The low-temperature (T≤ 25 K) resistivity of Al65Cu20Cr15 has been compared with that of Al63.5Cu24.5Fe12 alloy. In this region ρ(T) can be well described by a √T contribution arising from electron-electron interaction. We discuss our results in view of current theories.

Item Type:Article
Source:Copyright of this article belongs to American Physical Society.
ID Code:6639
Deposited On:22 Oct 2010 06:25
Last Modified:30 May 2011 09:20

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