Pinto, R. ; Kaur, Davinder ; Ramachandra Roa, M. S. ; Apte, P. R. ; Srinivasu, V. V. ; Vijayaraghavan, R. (1996) Microstructural dependence of penetration depth of Ag-doped YBa2Cu3O7−δ thin films probed by atomic force microscopy Applied Physics Letters, 68 (12). pp. 1720-1722. ISSN 0003-6951
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Official URL: http://apl.aip.org/resource/1/applab/v68/i12/p1720...
Related URL: http://dx.doi.org/10.1063/1.115917
Abstract
The magnetic penetration depth λ of laser ablated 5 wt % Ag-doped YBa2Cu3O7−δ thin films has been measured in the thickness range 1500-4000 Å and in the temperature range 18-88 K using microstrip resonator technique. A correlation of λ(T) with the film microstructure observed with atomic force microscopy has shown that λ(T) depends critically on the film microstructure.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Institute of Physics. |
| Keywords: | Atomic Force Microscopy; Barium Oxides; Copper Oxides; Doped Materials; High-TC Superconductors; Microstructure; Penetration Depth; Silver Additions; Superconducting Films; Temperature Dependence; Yttrium Oxides |
| ID Code: | 61663 |
| Deposited On: | 15 Sep 2011 12:00 |
| Last Modified: | 15 Sep 2011 12:00 |
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