Sinha, S. K. ; Feng, Y. P. ; Melendres, C. A. ; Lee, D. D. ; Russell, T. P. ; Satija, S. K. ; Sirota, E. B. ; Sanyal, M. K. (1996) Off-specular X-ray scattering studies of the morphology of thin films Physica A: Statistical and Theoretical Physics, 231 (1-3). pp. 99-110. ISSN 0378-4371
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Official URL: http://www.sciencedirect.com/science/article/pii/0...
Related URL: http://dx.doi.org/10.1016/0378-4371(96)00085-4
Abstract
We discuss the scattering of X-rays from thin films at a surface or interface decorated with a morphology of islands and how these effects manifest themselves in the specular reflectivity and the diffuse (off-specular) scattering. We show how this technique has been used to study block copolymer films decorated with islands on the surface and the development of electrochemically induced pitting on a Cu electrode in an electrolyte solution.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| ID Code: | 61359 |
| Deposited On: | 15 Sep 2011 03:42 |
| Last Modified: | 15 Sep 2011 03:42 |
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