Sanyal, M. K. ; Datta, A. ; Srivastava, A. K. ; Arora, B. M. ; Banerjee, S. ; Chakraborty, P. ; Caccavale, F. ; Sakata, O. ; Hashizume, H. (1998) Interfacial profile of a Bragg Mirror Applied Surface Science, 133 (1-2). pp. 98-102. ISSN 0169-4332
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Official URL: http://www.sciencedirect.com/science/article/pii/S...
Related URL: http://dx.doi.org/10.1016/S0169-4332(98)00184-6
Abstract
X-ray reflectivity and secondary ion mass spectrometry studies of a Bragg Mirror are presented. We find that the AlAs-on-AlGaAs interfaces are diffused due to formation of continuously varying composition of AlxGa1−xAs at the interfaces. On the other hand, the AlGaAs-on-AlAs interfaces are found to be sharp.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| Keywords: | Semiconductor Multilayers; Asymmetric Interfaces; Interdiffusion; X-Ray Reflectivity; Secondary Ion Mass Spectrometry |
| ID Code: | 61346 |
| Deposited On: | 15 Sep 2011 03:43 |
| Last Modified: | 15 Sep 2011 03:43 |
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