Determination of small fluctuations in electron density profiles of thin films: layer formation in a polystyrene film

Sanyal, M. K. ; Basu, J. K. ; Datta, A. ; Banerjee, S. (1996) Determination of small fluctuations in electron density profiles of thin films: layer formation in a polystyrene film Europhysics Letters, 36 (4). pp. 265-270. ISSN 0295-5075

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Official URL: http://iopscience.iop.org/0295-5075/36/4/265?fromS...

Related URL: http://dx.doi.org/10.1209/epl/i1996-00220-2

Abstract

A spin-coated thin polystyrene film on a silicon single crystal has been studied using the X-ray reflectivity technique. Signature of layering as a function of depth, due to confinement, in this polystyrene film could be detected from the reflectivity profile using a new analysis scheme. Small variations of electron density across the depth of a thin film can be determined from reflectivity data using this scheme with no a priori distribution of electron density profile.

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