Microwave studies of thin manganite films on SrTiO3 substrate

M., Golosovsky ; M., Abu-Teir ; D., Davidov ; O., Arnache ; P., Monod ; N., Bontemps ; Budhani, R. C. (2005) Microwave studies of thin manganite films on SrTiO3 substrate Journal of Applied Physics, 98 (8). 084902_1 - 084902_7. ISSN 0021-8979

Full text not available from this repository.

Official URL: http://ieeexplore.ieee.org/iel5/4915369/4949177/04...

Related URL: http://dx.doi.org/10.1063/1.2089162


We report phase-sensitive microwave studies of thin epitaxial manganite La1-xSrxMnO3 films on SrTiO3 substrate. The measurements were performed in the temperature range of 80-330 K using a contactless microwave scanning probe operating at 26 GHz with the aim of comparing dc resistivity and microwave resistivity. We find that the dc and the microwave resistivity of the La0.8Sr0.2MnO3 are almost the same, while for the La0.7Sr0.3MnO3 they are different above 200 K. Our analysis of different mechanisms of this discrepancy, together with our measurement of the ferromagnetic resonance on the same samples, yields the film inhomogeneity on the microscopic scale as the most probable explanation.

Item Type:Article
Source:Copyright of this article belongs to American Institute of Physics.
ID Code:5646
Deposited On:19 Oct 2010 11:39
Last Modified:23 May 2011 07:11

Repository Staff Only: item control page