Kulkarni, V. G. ; Lagu, R. G. ; Chandra, Girish ; Thosar, B. V. (1969) Positron annihilation in annealed and quenched teflon and in sulphur Proceedings of the Indian Academy of Sciences - Mathematical Sciences, 72 (2). pp. 88-93. ISSN 0253-4142
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Official URL: http://www.ias.ac.in/j_archive/proca/72/2/88-93/vi...
Related URL: http://dx.doi.org/10.1007/BF03050409
Abstract
The value (τ2) and the intensity (I2) of the delayed component in the lifetime spectra of positrons annihilating in annealed and quenched teflon and in sulphur and crystex (polymer sulphur), at room temperature and at 77° K are reported. These data and the X-ray diffraction patterns for these materials are discussed in terms of the free volume model for the formation and quenching of positronium atoms in molecular materials.
| Item Type: | Article |
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| Source: | Copyright of this article belongs to Indian Academy of Sciences. |
| ID Code: | 53636 |
| Deposited On: | 09 Aug 2011 11:35 |
| Last Modified: | 18 May 2016 06:42 |
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