Analysis of microresidual stresses in 6H-SiC particles within Al2O3-SiC-(Al,Si) CMC using Raman spectroscopy

Arvind Singh, R. ; Sood, A. K. ; Jayaram, V. ; Biswas, S. K. (1998) Analysis of microresidual stresses in 6H-SiC particles within Al2O3-SiC-(Al,Si) CMC using Raman spectroscopy Scripta Materialia, 38 (4). pp. 617-622. ISSN 1359-6462

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Official URL: http://www.sciencedirect.com/science/article/pii/S...

Related URL: http://dx.doi.org/10.1016/S1359-6462(97)00518-6

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Item Type:Article
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Deposited On:22 Jul 2011 13:50
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