High temperature X-ray diffraction studies on Cr-doped V2O3

Chandrashekhar, G. V. ; Sinha, A. P. B. (1974) High temperature X-ray diffraction studies on Cr-doped V2O3 Materials Research Bulletin, 9 (6). pp. 787-797. ISSN 0025-5408

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Official URL: http://www.sciencedirect.com/science/article/pii/0...

Related URL: http://dx.doi.org/10.1016/0025-5408(74)90114-7

Abstract

X ray powder diffraction on high purity (Cr0.01V0.99)2O3 and (Cr0.033V0.967)2O3 prepared by the arc-melting technique has been carried out in the temperature range of room temperature to 500° C. The room temperature rhombohedral structure of (Cr0.01V0.99)2O3 is found to undergo, in agreement with earlier results, a gradual transition to an isomorphous, high-temperature rhombohedral structure over a temperature range of 50-200° C. The percentage of the two phases in this coexistence range has been determined at different temperatures from the relative X ray intensities. This is found to depend on the thermal history of the sample and shows considerable hysteresis between heating and cooling cycles. Annealing of the material at 1600° C is found to stabilize the low temperature form and to broaden the temperature region of the transition. The temperature interval of the electrical anomaly correlates well with the two-phase interval. The lattice parameters and their temperature coefficients have been determined for all the phases.

Item Type:Article
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ID Code:49014
Deposited On:18 Jul 2011 09:46
Last Modified:18 Jul 2011 09:46

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