Photoelectron spectroscopic studies on a silicon interface with Bi2Sr2CaCu2BO8+δ high Tc superconductor

Kulkarni, Pramada ; Mahamuni, Shailaja ; Chandrachood, M. ; Mulla, I. S. ; Sinha, A. P. B. ; Nigavekar, A. S. ; Kulkarni, S. K. (1990) Photoelectron spectroscopic studies on a silicon interface with Bi2Sr2CaCu2BO8+δ high Tc superconductor Journal of Applied Physics, 67 (7). 3438_1-3438_5. ISSN 0021-8979

Full text not available from this repository.

Official URL: http://jap.aip.org/resource/1/japiau/v67/i7/p3438_...

Related URL: http://dx.doi.org/10.1063/1.345330

Abstract

X-ray and ultraviolet photoelectron spectroscopies have been used to investigate the interaction between silicon and Bi2Sr2CaCu2O8+δ high Tc superconducting material. For low coverages, silicon adatoms disrupt CuO bonds and SrO bonds to form a complex Sr-Si-O phase. This interlayer efficiently prevents further reaction between silicon and the Bi2Sr2CaCu2O8+δ superconductor.

Item Type:Article
Source:Copyright of this article belongs to American Institute of Physics.
Keywords:Bismuth Oxides; Strontium Oxides; Calcium Oxides; Copper Oxides; High-Tc Superconductors; Silicon; Interface Structure; Photoelectron Spectroscopy; X Radiation; Ultraviolet Radiation; Chemical Bonds
ID Code:48934
Deposited On:18 Jul 2011 10:14
Last Modified:17 Jul 2012 00:30

Repository Staff Only: item control page