Sharma, Surinder M. ; Sikka, S. K. (1982) Statistical analysis of positron annihilation and Compton profile experiments using normal probability plots Philosophical Magazine B, 45 (3). pp. 317-322. ISSN 1364-2812
Full text not available from this repository.
Official URL: http://www.informaworld.com/smpp/content~db=all~co...
Related URL: http://dx.doi.org/10.1080/13642818208246407
Abstract
The use of normal probability plots as a sensitive method for statistical processing of experimental data from positron annihilation angular correlation and Compton profile experiments is suggested. Examples showing the superiority of this method over the x2 method used hitherto, are discussed.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Taylor and Francis Group. |
| ID Code: | 48209 |
| Deposited On: | 13 Jul 2011 14:20 |
| Last Modified: | 12 Jul 2012 07:52 |
Repository Staff Only: item control page
