Memory effect in low-density amorphous silicon under pressure

Garg, Nandini ; Pandey, K. K. ; Shanavas, K. V. ; Betty, C. A. ; Sharma, Surinder M. (2011) Memory effect in low-density amorphous silicon under pressure Physical Review B: Condensed Matter and Materials Physics, 83 (11). 115202_1-115202_6. ISSN 1098-0121

Full text not available from this repository.

Official URL: http://prb.aps.org/abstract/PRB/v83/i11/e115202

Related URL: http://dx.doi.org/10.1103/PhysRevB.83.115202

Abstract

Our investigations on porous Si (π-Si) show that on increase of pressure it undergoes crystalline phase transitions instead of pressure-induced amorphization, as suggested earlier, and the amorphous phase appears only on release of pressure. This amorphous phase, when subjected to higher pressures, transforms reversibly to a higher-coordinated primitive hexagonal phase, showing a kind of memory effect which may be the only example of its kind in the elemental solids. First-principles calculations and thermodynamic arguments help understand these observations.

Item Type:Article
Source:Copyright of this article belongs to The American Physical Society.
ID Code:48203
Deposited On:14 Jul 2011 08:34
Last Modified:14 Jul 2011 08:34

Repository Staff Only: item control page