Probing of thin slipping films by persistent external disturbances

Alleborn, N. ; Sharma, A. ; Delgado, A. (2007) Probing of thin slipping films by persistent external disturbances Canadian Journal of Chemical Engineering, 85 (5). pp. 586-597. ISSN 0008-4034

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This paper investigates the propagation of thickness disturbances on the free surface of a thin viscous liquid film on a solid substrate. On the free surface of the film the disturbances are induced by moving local external pressure perturbations acting on the surface. The analysis is performed by the Fourier-Laplace transform applied to the linearized perturbation equations for small amplitudes. The amplitude of the interface deflection caused by the disturbance, is reconstructed by the inverse Fourier-Laplace transform and numerically evaluated in the long time limit in long wave approximation. The proposed technique appears promising for probing the slip length of a thin film by recording its free surface response to a moving perturbation.

Item Type:Article
Source:Copyright of this article belongs to John Wiley and Sons.
Keywords:Free Surface Flow; Signal-response Analysis; Long Wave Approximation; Slippage; Thin Films
ID Code:46984
Deposited On:06 Jul 2011 11:02
Last Modified:06 Jul 2011 11:02

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