Photoemission and inverse photoemission of transition-metal silicides

Speier, W. ; Leuken, E. v. ; Fuggle, J. C. ; Sarma, D. D. ; Kumar, L. ; Dauth, B. ; Buschow, K. H. J. (1989) Photoemission and inverse photoemission of transition-metal silicides Physical Review B: Condensed Matter and Materials Physics, 39 (9). pp. 6008-6016. ISSN 1098-0121

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Official URL: http://prb.aps.org/abstract/PRB/v39/i9/p6008_1

Related URL: http://dx.doi.org/10.1103/PhysRevB.39.6008

Abstract

We present selected results of an experimental and theoretical study of the electronic structure of 3d, 4d, and 5d transition-metal silicides. We have employed x-ray photoemission (XPS) and bremsstrahlung isochromat spectroscopy (BIS) as experimental techniques and calculated the density of states of the compounds in their real crystal structures. The main objective of this paper is to show that by explicit inclusion of the appropriate theoretical solid-state matrix elements for XPS and BIS, we are able to analyze the experimental spectra in detail with respect to the various symmetries contributing to the total spectra. In particular, we obtain information on all the symmetries which are most relevant for the bonding in transition-metal silicides, namely the Si s and Si p states and metal d states. Finally, we compare our XPS results with published photoemission data at lower excitation energy.

Item Type:Article
Source:Copyright of this article belongs to The American Physical Society.
ID Code:46231
Deposited On:02 Jul 2011 13:53
Last Modified:02 Jul 2011 13:53

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