X-ray absorption spectroscopic study of mixed valence systems EuCu2Si2, YbCu2Si2 and Sm4Bi3

Hatwar, T. K. ; Nayak, R. M. ; Padalia, B. D. ; Ghatikar, M. N. ; Sampathkumaran, E. V. ; Gupta, L. C. ; Vijayaraghavan, R. (1980) X-ray absorption spectroscopic study of mixed valence systems EuCu2Si2, YbCu2Si2 and Sm4Bi3 Solid State Communications, 34 (8). pp. 617-620. ISSN 0038-1098

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Official URL: http://linkinghub.elsevier.com/retrieve/pii/003810...

Related URL: http://dx.doi.org/10.1016/0038-1098(80)90939-4

Abstract

X-ray absorption spectroscopy technique is employed to determine the valence of the rare earth ions in EuCu2Si2, YbCu2Si2 and Sm4Bi3. In each case, two absorption peaks corresponding to two different valence states of respective rare earth ions have been observed. Low temperature (77 K) study of EuCu2Si2 indicates distinct change in the relative intensities of the absorption peaks compared to those registered at room temperature (300 K). It is inferred from the change in the relative intensities that the population of Eu2+ in EuCu2Si2 decreases at liquid nitrogen temperature compared to Eu3+. Conclusions drawn from these results agree well with those reported by others using different experimental techniques. In Sm4Bi3, Sm2+ and Sm3+ are found to occur in the ratio of 3:1.

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