Direct lattice imaging of silicon carbide

Gai, P. L. ; Anderson, J. S. ; Rao, C. N. R. (1975) Direct lattice imaging of silicon carbide Journal of Physics D: Applied Physics, 8 (13). L157-L158. ISSN 0022-3727

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The high-resolution electron microscopic technique of lattice imaging shows 15 and 3 AA repeat sequences in 6H SiC. The 15 AA sequence is further resolved into 2.5 AA layers corresponding to the interlayer separation.

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Deposited On:23 Jun 2011 05:20
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