Raychaudhuri, A. K. (2002) Measurement of 1/f noise and its application in materials science Current Opinion in Solid State and Materials Science, 6 (1). pp. 67-85. ISSN 1359-0286
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Official URL: http://linkinghub.elsevier.com/retrieve/pii/S13590...
Related URL: http://dx.doi.org/10.1016/S1359-0286(02)00025-6
Abstract
This is a review of the measurement of 1/f noise in certain classes of materials which have a wide range of potential applications. This includes metal films, semiconductors, metallic oxides and inhomogeneous systems such as composites. The review contains a basic introduction to this field, the theories and models and follows it up with a discussion on measurement methods. There are discussions on specific examples of the application of noise spectroscopy in the field of materials science.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| ID Code: | 42671 |
| Deposited On: | 04 Jun 2011 14:00 |
| Last Modified: | 04 Jun 2011 14:00 |
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