Sampathkumaran, E. V. ; Vijayaraghavan, R. ; Sen, P. ; Rao, C. N. R. (1987) Ce CORE level X-ray photoelectron spectroscopy of CeX2Si2 (X=Fe, Co, Ni and Cu) Solid State Communications, 63 (4). pp. 345-347. ISSN 0038-1098
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Official URL: http://linkinghub.elsevier.com/retrieve/pii/003810...
Related URL: http://dx.doi.org/10.1016/0038-1098(87)90922-7
Abstract
Ce(3d) and (4d) core level XPS spectra of CeX=Fe, Co, Ni and Cu) suggest that the mean valence of Ce was as well as 4f hybridization strength decrease systematically from Fe to Cu. This observation is in agreement with the results of Bremstrahlung Isochromat Spectroscopy (BIS), but in disagreement with LIII-edge data reported earlier.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| ID Code: | 42197 |
| Deposited On: | 02 Jun 2011 06:24 |
| Last Modified: | 02 Jun 2011 06:24 |
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