Contrast from stacking faults in field-ion micrographs of hcp metals

Ranganathan, S. (1970) Contrast from stacking faults in field-ion micrographs of hcp metals Surface Science, 20 (2). pp. 429-433. ISSN 0039-6028

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Official URL: http://www.sciencedirect.com/science/article/pii/0...

Related URL: http://dx.doi.org/10.1016/0039-6028(70)90195-0

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Item Type:Article
Source:Copyright of this article belongs to Elsevier Science.
ID Code:41996
Deposited On:01 Jun 2011 12:57
Last Modified:01 Jun 2011 12:57

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