Contrast from twin boundaries in field-ion micrographs

Chandrasekharaiah, M. N. ; Ranganathan, S. (1969) Contrast from twin boundaries in field-ion micrographs Journal of Applied Physics, 40 (12). pp. 4835-4836. ISSN 0021-8979

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Official URL: http://jap.aip.org/resource/1/japiau/v40/i12/p4835...

Related URL: http://dx.doi.org/10.1063/1.1657298

Abstract

Computer simulation and geometrical construction have been used to study the contrast from twin boundaries in field-ion micrographs. For specific orientations of the twin boundary, m rings of (hkl) planes in the matrix are expected to match with n rings of (h'k'l) planes in the twin, where m and n are integers and (hkl) and (h'k'l) are prominent planes in the matrix and the twin, respectively.

Item Type:Article
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ID Code:41995
Deposited On:01 Jun 2011 12:56
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