Wooster, W. A. ; Ramachandran, G. N. ; Lang, A. (1948) A note on the use of X-ray counter-spectrometers for single-crystal measurements Journal of Scientific Instruments, 25 (12). pp. 405-407. ISSN 0950-7671
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Official URL: http://iopscience.iop.org/0950-7671/25/12/303
Related URL: http://dx.doi.org/10.1088/0950-7671/25/12/303
Abstract
Some experiments are described in which a counter-spectrometer method is compared with an X-ray photographic method as a means of determining the integrated reflexion of a number of reflexions. The advantages and limitations of the photographic, ionization and counter-spectrometers are discussed, and it is concluded that for long exposures the photographic spectrometer is as sensitive as the counter-spectrometer used for a few minutes and more sensitive than the ionization spectrometer. For convenience and speed of measurement the counter-spectrometer is probably the best instrument.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Institute of Physics. |
| ID Code: | 34155 |
| Deposited On: | 01 Apr 2011 12:52 |
| Last Modified: | 01 Apr 2011 12:52 |
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