Gupta, P. D. ; Goel, S. K. ; Bhawalkar, D. D. (1980) Determination of a soft X-ray spectrum by photoelectron analysis Journal of Applied Physics, 51 (4). pp. 1873-1875. ISSN 0021-8979
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Official URL: http://link.aip.org/link/japiau/v51/i4/p1873/s1
Related URL: http://dx.doi.org/10.1063/1.327898
Abstract
A scheme is proposed and discussed for obtaining soft and ultrasoft x ray spectrums by photoelectron analysis. It is shown that by combining a grating or crystal spectrometer with a photoelectron spectrometer, the x ray spectrum can be obtained unambiguously over a wide range of wavelengths.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Institute of Physics. |
| Keywords: | X-ray Spectra; Photoelectron Spectroscopy; Photons; Optical Spectra; Design; Crystals; Spectrometers; Energy Spectra; Wavelenths |
| ID Code: | 3341 |
| Deposited On: | 11 Oct 2010 09:02 |
| Last Modified: | 18 May 2011 16:34 |
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