Tc degradation in cuprate superconductors from the resistivity of YBa2(Cu1-xMx)4O8 for M=Fe and Ni

Lal, Ratan ; Awana, V. P. S. ; Pandey, S. P. ; Yadav, V. S. ; Varandani, Deepak ; Narlikar, A. V. ; Chhikara, Anjli ; Gmelin, E. (1995) Tc degradation in cuprate superconductors from the resistivity of YBa2(Cu1-xMx)4O8 for M=Fe and Ni Physical Review B: Condensed Matter and Materials Physics, 51 (1). pp. 539-546. ISSN 1098-0121

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Official URL: http://prb.aps.org/abstract/PRB/v51/i1/p539_1

Related URL: http://dx.doi.org/10.1103/PhysRevB.51.539

Abstract

Systematic measurements of the resistivity of the polycrystalline samples of the YBa2(Cu1−xMx)4O8 system with M=Fe, Ni are reported. The resistivity behavior depends strongly on the dopant concentration. For the Fe 6-at. % sample, there is no metallic behavior in the resistivity, but for T > 50 K, the resistivity decreases very slowly with temperature. The behavior of the resistivity of the Fe 10-at. % and Ni 5-at. % samples is analyzed, and it is found that the variable-range hopping process may occur in these samples below about 30 K. While the Ni 5-at. % sample is found to show signs of the nearest-neighbor hopping process of conductivity above about 150 K, the Fe 10-at. % sample does not show such behavior up to 300 K. On this basis it is found that localization may not be a possible reason of the large Tc depression in the YBa2(Cu1−xMx)4O8 system by the Fe and Ni dopants. We have examined the possibility of Tc degradation due to carrier-impurity potential scattering also by using a single-crystal analog of the polycrystalline sample. This analogy is justified to within a factor of less than 1.33. On the basis of this analogy we have found that potential scattering may not be a reasonable source of Tc degradation in the Ni- and Fe-doped samples of the system considered.

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