Typing a semiconductor with point contacts

Dhar, S. ; Nag, B. R. (1982) Typing a semiconductor with point contacts Review of Scientific Instruments, 53 (2). pp. 217-220. ISSN 0034-6748

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Official URL: http://rsi.aip.org/resource/1/rsinak/v53/i2/p217_s...

Related URL: http://dx.doi.org/10.1063/1.1136930


The results of typing measurements of semiconductor samples using a metal-semiconductor point contact technique, under different experimental conditions, are presented. The information obtained from these experiments has been verified for correctness by using standard techniques. A circuit arrangement is described which can be attached to a conventional four-probe resistivity jig in order to extend the applicability of the latter for determination of the type of a sample along with its resistivity measurements.

Item Type:Article
Source:Copyright of this article belongs to American Institute of Physics.
ID Code:28594
Deposited On:15 Dec 2010 11:50
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