Sen, Susanta ; Saha, P. K. ; Nag, B. R. (1979) New cavity perturbation technique for microwave measurement of dielectric constant Review of Scientific Instruments, 50 (12). pp. 1594-1597. ISSN 0034-6748
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Official URL: http://rsi.aip.org/resource/1/rsinak/v50/i12/p1594...
Related URL: http://dx.doi.org/10.1063/1.1135772
Abstract
A new cavity perturbation technique is presented for microwave measurement of dielectric constant, which uses a modified cylindrical reentrant cavity. Though suitable for only low dielectric constants, the method has the advantages, (a) sample area does not appear in the calculations, (b) only the ratio of frequency shifts due to two samples of same area and different thickness is involved, and (c) calibration of the measuring system with known dielectric is not necessary.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Institute of Physics. |
| ID Code: | 28593 |
| Deposited On: | 15 Dec 2010 11:51 |
| Last Modified: | 08 Jun 2011 07:39 |
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