Mossbauer spectroscopy of ion-bombarded material surfaces

Ogale, S. B. ; Ghaisas, S. V. ; Kanetkar, S. M. ; Bhide, V. G. (1985) Mossbauer spectroscopy of ion-bombarded material surfaces Proceedings of the Indian Academy of Sciences - Chemical Sciences, 95 (1-2). pp. 207-227. ISSN 0253-4134

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Recent trends in the field of ion bombardment of material surfaces are reviewed with a brief discussion about the present understanding of the subject. The use of novel characterization concepts to explore the ion beam-induced phenomena is emphasized and in this context the importance of the technique of conversion electron Mossbauer spectroscopy (CEMS) is brought out. A number of specific examples of the use ofCEMS technique to studies on ion implantation, ion beam mixing and corrosion of ion-bombarded surfaces have been given.

Item Type:Article
Source:Copyright of this article belongs to Indian Academy of Sciences.
Keywords:Mossbauer Spectroscopy; Ion Bombardment; Ion Implantation; Material Surfaces
ID Code:26933
Deposited On:08 Dec 2010 12:58
Last Modified:17 May 2016 10:13

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