Self-field-induced flux creep in YBa2Cu3O7-y thin films

Kumar, Ravi ; Malik, S. K. ; Pai, S. P. ; Apte, P. R. ; Pinto, R. ; Vijayaraghavan, R. ; Kumar, Dhanajay (1992) Self-field-induced flux creep in YBa2Cu3O7-y thin films Physical Review B, 46 (9). pp. 5766-5768. ISSN 0163-1829

Full text not available from this repository.

Official URL: http://prb.aps.org/abstract/PRB/v46/i9/p5766_1

Related URL: http://dx.doi.org/10.1103/PhysRevB.46.5766

Abstract

Self-field-induced flux creep has been studied in YBa2Cu3O7-y thin films under zero external magnetic field at various temperatures below Tc. The results are analyzed on the basis of Anderson-Kim flux creep model extended to include the self-fields. The variation of the pinning potential, U0, as a function of temperature is obtained.

Item Type:Article
Source:Copyright of this article belongs to American Physical Society.
ID Code:23297
Deposited On:25 Nov 2010 09:21
Last Modified:06 Jun 2011 11:49

Repository Staff Only: item control page