EPR studies on amorphous Ge-Al and Ge-Cu films

Randhawa, H. S. ; Malhotra, L. K. ; Chopra, K. L. (1978) EPR studies on amorphous Ge-Al and Ge-Cu films Journal of Applied Physics, 49 (7). pp. 4294-4295. ISSN 0021-8979

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Official URL: http://jap.aip.org/resource/1/japiau/v49/i7/p4294_...

Related URL: http://dx.doi.org/10.1063/1.325353

Abstract

Electron paramagnetic resonance in amorphous germanium (a-Ge) alloy films containing varying concentrations of Al and Cu has been studied. The concentration of free spins (dangling bonds) is found to decrease rapidly on alloying to less than 5× 1017/cm3 for about 8 at.% Al and 10 at.% Cu concentrations. The g factor and line shape remain unaffected on alloying. The linewidth, however, shows minor changes.

Item Type:Article
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ID Code:23177
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