EPR studies on amorphous Ge-Al and Ge-Cu films

Randhawa, H. S. ; Malhotra, L. K. ; Chopra, K. L. (1978) EPR studies on amorphous Ge-Al and Ge-Cu films Journal of Applied Physics, 49 (7). pp. 4294-4295. ISSN 0021-8979

Full text not available from this repository.

Official URL: http://jap.aip.org/resource/1/japiau/v49/i7/p4294_...

Related URL: http://dx.doi.org/10.1063/1.325353


Electron paramagnetic resonance in amorphous germanium (a-Ge) alloy films containing varying concentrations of Al and Cu has been studied. The concentration of free spins (dangling bonds) is found to decrease rapidly on alloying to less than 5× 1017/cm3 for about 8 at.% Al and 10 at.% Cu concentrations. The g factor and line shape remain unaffected on alloying. The linewidth, however, shows minor changes.

Item Type:Article
Source:Copyright of this article belongs to American Institute of Physics.
ID Code:23177
Deposited On:25 Nov 2010 13:21
Last Modified:28 May 2011 09:00

Repository Staff Only: item control page