Effect of bottom electrodes on the structural and electrical characteristics of lanthanum doped lead titanate thin films

Bhaskar, S. ; Majumder, S. B. ; Dobal, P. S. ; Katiyar, R. S. ; Krupanidhi, S. B. (2001) Effect of bottom electrodes on the structural and electrical characteristics of lanthanum doped lead titanate thin films Integrated Ferroelectrics, 36 (1-4). pp. 245-254. ISSN 1058-4587

Full text not available from this repository.

Official URL: http://www.informaworld.com/smpp/content~db=all~co...

Related URL: http://dx.doi.org/10.1080/10584580108015546

Abstract

Ferroelectric Pb0.90La0.15TiO3 (PLT15) thin films were deposited by sol-gel method on Pt, Pt/Si, ruthenium oxide (RuO2)/Si and RuO2/Pt/Si bottom electrodes. X-ray diffraction, and micro-Raman spectroscopy techniques were used for structural characterization of these films. PLT15 films deposited on RuO2 electrodes show (100) preferred orientation of growth and result in larger crystallites. Films on Pt electrode exhibited higher dielectric constant (1300 at 100 kHz) and high values of Pm, Pr values, 68 and 46 µ C/cm2 respectively. AC field dependence of dielectric permittivity at sub-switching fields was fitted using the Rayleigh law. The reversible polarization components estimated from the CV and quasi-static hysteresis measurements for films on Pt/Si (24%), was larger than that of Pt (11%) bottom electrodes. The observed results were correlated with the domain wall pinning at the disturbed film-electrode interface.

Item Type:Article
Source:Copyright of this article belongs to Taylor and Francis Ltd.
Keywords:La Modified PbTiO3; Ruthenium Oxide; Bottom Electrodes
ID Code:19472
Deposited On:22 Nov 2010 18:02
Last Modified:06 Jun 2011 14:51

Repository Staff Only: item control page