ZnO nanocrystalline thin films: a correlation of microstructural, optoelectronic properties

Patil, V. B. ; Pawar, S. G. ; Patil, S. L. ; Krupanidhi, S. B. (2010) ZnO nanocrystalline thin films: a correlation of microstructural, optoelectronic properties Journal of Materials Science: Materials in Electronics, 21 (4). pp. 355-359. ISSN 0957-4522

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Official URL: http://www.springerlink.com/content/jmt60725072n84...

Related URL: http://dx.doi.org/10.1007/s10854-009-9920-5

Abstract

The compositional, structural, microstructural, dc electrical conductivity and optical properties of undoped zinc oxide films prepared by the sol-gel process using a spin-coating technique were investigated. The ZnO films were obtained by 5 cycle spin-coated and dried zinc oxide films followed by annealing in air at 600 ° C. The films deposited on the platinum coated silicon substrate were crystallized in a hexagonal wurtzite form. The energy-dispersive X-ray (EDX) spectrometry shows Zn and O elements in the products with an approximate molar ratio. TEM image of ZnO thin film shows that a grain of about 60-80 nm in size is really an aggregate of many small crystallites of around 10-20 nm. Electron diffraction pattern shows that the ZnO films exhibited hexagonal structure. The SEM micrograph showed that the films consist in nanocrystalline grains randomly distributed with voids in different regions. The dc conductivity found in the range of 10-5-10-6 (Ω cm)-1. The optical study showed that the spectra for all samples give the transparency in the visible range.

Item Type:Article
Source:Copyright of this article belongs to Springer-Verlag.
ID Code:19312
Deposited On:23 Nov 2010 13:09
Last Modified:17 May 2016 03:53

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