A study of laser-ion-deposited carbon films on tungsten by x-ray diffraction, field ion microscopy, and electron spectroscopy

Wagal, S. S. ; Adhi, K. P. ; Joag, D. S. ; Sharma, A. K. ; Abhyankar, Neelima ; Kulkarni, S. K. (1992) A study of laser-ion-deposited carbon films on tungsten by x-ray diffraction, field ion microscopy, and electron spectroscopy Journal of Applied Physics, 71 (2). pp. 1052-1054. ISSN 0021-8979

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Official URL: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumb...

Related URL: http://dx.doi.org/10.1063/1.350397

Abstract

Thin carbon films have been deposited on polycrystalline tungsten foil as well as field ion microscope (FIM) tips by laser-ion deposition in a high-vacuum environment with an ion extraction voltage of -2 kV. Structural characterization of these films has been carried out by using low-angle x-ray diffraction (XRD) and FIM. The low-angle XRD reveals the formation of an interfacial α-W2C phase. The FIM image indicates the formation of the α-W2C phase on the tungsten tip. X-ray photoelectron spectroscopy has been utilized to reveal that the bonding character in the film is sp3. Further, x-ray-excited Auger electron spectroscopy has also supported the diamondlike nature of the films. The results are discussed, and a sequence of layers deposited on tungsten is suggested in view of the structural match.

Item Type:Article
Source:Copyright of this article belongs to American Institute of Physics.
ID Code:18018
Deposited On:17 Nov 2010 13:20
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