Influence of deposition parameters on the properties of boron-doped amorphous silicon-carbide films

Ray, Swati ; Ganguly, Gautam ; Barua, A. K. (1987) Influence of deposition parameters on the properties of boron-doped amorphous silicon-carbide films Journal of Applied Physics, 62 (9). p. 3917. ISSN 0021-8979

Full text not available from this repository.

Official URL: http://link.aip.org/link/?JAPIAU/62/3917/1

Related URL: http://dx.doi.org/10.1063/1.339209

Abstract

The optoelectronic properties of p-type a-Si1-xCx:H deposited by glow-discharge decomposition have been studied at different deposition temperatures and with varying methane concentration. The optical band gap is found to increase at lower temperatures and with higher methane concentrations. Infrared transmittance spectra reveal that the increase is due to carbon and/or hydrogen incorporation. Electron-spin-resonance spectra have been analyzed to show that the dangling bond density increases with carbon content. Low-temperature deposited films are found to posess a large (~1018 cm-3) trapped hole density, indicating a broad valence band tail. It has been found that for a band gap of about 2 eV the optoelectronic properties are similar for low- and high-temperature deposited samples.

Item Type:Article
Source:Copyright of this article belongs to American Institute of Physics.
ID Code:1632
Deposited On:05 Oct 2010 12:10
Last Modified:13 May 2011 10:00

Repository Staff Only: item control page