Srinivasu, V. V. ; Thomas, Boben ; Vasanthacharya, N. Y. ; Hegde, M. S. ; Bhat, S. V. (1991) Critical current density measurements of YBa2Cu3O7-x thin films by non-resonant r.f. absorption method Solid State Communications, 79 (9). pp. 713-716. ISSN 0038-1098
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Official URL: http://linkinghub.elsevier.com/retrieve/pii/003810...
Related URL: http://dx.doi.org/10.1016/0038-1098(91)90783-R
Abstract
A new, contact-less technique for the measurement of the critical current density Jc using the non-resonant r.f. absorption phenomenon is proposed. Jc in thin film samples of YBa2Cu3O7-x prepared by pulsed laser deposition are measured by this technique as well as the transport current method. Satisfactory agreement is obtained between the results of the two techniques.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| ID Code: | 16210 |
| Deposited On: | 15 Nov 2010 14:01 |
| Last Modified: | 27 May 2011 06:50 |
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