A Fault Analysis Perspective for Testing of Secured SoC Cores

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Ali, Sk Subidh ; Mazumdar, Bodhisatwa ; Mukhopadhyay, Debdeep (2013) A Fault Analysis Perspective for Testing of Secured SoC Cores IEEE Design & Test, 30 (5). pp. 63-73. ISSN 2168-2356

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Official URL: https://doi.org/10.1109/MDAT.2013.2252951

Related URL: http://dx.doi.org/10.1109/MDAT.2013.2252951

Abstract

Can the inputs of a cryptocore be stressed to leak the secret key? This article demonstrates such a vulnerability challenging secure integration of these cores in a system-on-chip design.

Item Type:	Article
Source:	Copyright of this article belongs to IEEE.
Keywords:	Aes; Aes Key Schedule; Differential Fault Analysis; Fault Model; SOC
ID Code:	142860
Deposited On:	25 Jun 2026 10:43
Last Modified:	25 Jun 2026 10:43

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