Mondal, Arijit ; Chakrabarti, P. P. ; Dasgupta, Pallab (2012) Symbolic-Event-Propagation-Based Minimal Test Set Generation for Robust Path Delay Faults ACM Transactions on Design Automation of Electronic Systems, 17 (4). pp. 1-20. ISSN 1084-4309
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Official URL: http://doi.org/10.1145/2348839.2348851
Related URL: http://dx.doi.org/10.1145/2348839.2348851
Abstract
We present a symbolic-event-propagation-based scheme to generate hazard-free tests for robust path delay faults. This approach identifies all robustly testable paths in a circuit and the corresponding complete set of test vectors. We address the problem of finding a minimal set of test vectors that covers all robustly testable paths. We propose greedy and simulated-annealing-based algorithms to find the same. Results on ISCAS89 benchmark circuits show a considerable reduction in test vectors for covering all robustly testable paths.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Association for Computing Machinery |
| ID Code: | 129752 |
| Deposited On: | 21 Nov 2022 03:46 |
| Last Modified: | 21 Nov 2022 03:46 |
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