Characterization of Nanomaterials by Physical Methods

Rao, C.N.R. ; Biswas, Kanishka (2009) Characterization of Nanomaterials by Physical Methods Annual Review of Analytical Chemistry, 2 (1). pp. 435-462. ISSN 1936-1327

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Official URL: http://doi.org/10.1146/annurev-anchem-060908-15523...

Related URL: http://dx.doi.org/10.1146/annurev-anchem-060908-155236

Abstract

Much progress in nanoscience and nanotechnology has been made in the past few years thanks to the increased availability of sophisticated physical methods to characterize nanomaterials. These techniques include electron microscopy and scanning probe microscopies, in addition to standard techniques such as X-ray and neutron diffraction, X-ray scattering, and various spectroscopies. Characterization of nanomaterials includes the determination not only of size and shape, but also of the atomic and electronic structures and other important properties. In this article we describe some of the important methods employed for characterization of nanostructures, describing a few case studies for illustrative purposes. These case studies include characterizations of Au, ReO3, and GaN nanocrystals; ZnO, Ni, and Co nanowires; inorganic and carbon nanotubes; and two-dimensional graphene.

Item Type:Article
Source:Copyright of this article belongs to Annual Reviews
Keywords:electron microscopy, scanning probe microscopies, diffraction, nanocrystals, nanowires, nanotubes
ID Code:128077
Deposited On:03 Nov 2022 05:43
Last Modified:03 Nov 2022 05:43

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