Testing aspherics using two-wavelength holography: use of digital electronic techniques

Wyant, J. C. ; Oreb, B. F. ; Hariharan, P. (1984) Testing aspherics using two-wavelength holography: use of digital electronic techniques Applied Optics, 23 (22). pp. 4020-4023. ISSN 0003-6935

Full text not available from this repository.

Official URL: http://www.opticsinfobase.org/ao/abstract.cfm?URI=...

Related URL: http://dx.doi.org/10.1364/AO.23.004020

Abstract

Two-wavelength holography has been shown to be quite useful for testing aspheric surfaces since it can produce interferograms with a wide range of sensitivities. However, TWH has the drawback that the accuracy attainable from measurements on photographs of the fringes is limited. It is shown how this limitation can be overcome by using digital electronic techniques to evaluate the phase distribution in the interference pattern.

Item Type:Article
Source:Copyright of this article belongs to Optical Society of America.
ID Code:12728
Deposited On:11 Nov 2010 09:04
Last Modified:03 Jun 2011 07:03

Repository Staff Only: item control page